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"Impact of back side circuit edit on active device performance in bulk ..."

Uwe Kerst et al. (2005)

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DOI: 10.1109/TEST.2005.1584092

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/itc/KerstSKRLP05
Uwe Kerst, Rudolf Schlangen, A. Kabakow, Erwan Le Roy, Ted R. Lundquist, Siegfried Pauthner:
Impact of back side circuit edit on active device performance in bulk silicon ICs. ITC 2005: 9

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