"Test support processors for enhanced testability of high performance circuits."

David C. Keezer, Q. Zhou (1999)

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DOI: 10.1109/TEST.1999.805811

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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David C. Keezer, Q. Zhou:
Test support processors for enhanced testability of high performance circuits. ITC 1999: 801-809

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