"Active reliability monitor: Defect level extrinsic reliability monitoring ..."

Michael Johnson et al. (2016)

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DOI: 10.1109/TEST.2016.7805871

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Michael Johnson, Brian Noble, Mark Johnson, Jim Crafts, Cynthia Manya, John Deforge:
Active reliability monitor: Defect level extrinsic reliability monitoring on 22nm POWER8 and zSeries processors. ITC 2016: 1-8

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