BibTeX record conf/itc/Hsieh98

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@inproceedings{DBLP:conf/itc/Hsieh98,
  author    = {Luke S. L. Hsieh},
  title     = {Reduction of errors due to source and meter in the nonlinearity test},
  booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
               DC, USA, October 18-22, 1998},
  pages     = {254--257},
  publisher = {{IEEE} Computer Society},
  year      = {1998},
  url       = {https://doi.org/10.1109/TEST.1998.743160},
  doi       = {10.1109/TEST.1998.743160},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/Hsieh98.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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