"Implementing bead probe technology for in-circuit test: A case study."

Mike Farrell, Glen Leinbach (2007)

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DOI: 10.1109/TEST.2007.4437599

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Mike Farrell, Glen Leinbach:
Implementing bead probe technology for in-circuit test: A case study. ITC 2007: 1-8

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