"Impact of Mixed-Mode Self Test on Life Cycle Cost of VLSI Based Design."

Yacoub M. El-Ziq, Hamid H. Butt (1984)

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type: Conference or Workshop Paper

metadata version: 2002-11-22

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Yacoub M. El-Ziq, Hamid H. Butt:
Impact of Mixed-Mode Self Test on Life Cycle Cost of VLSI Based Design. ITC 1984: 338-349

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