"An Optimal Test Sequence for the JTAG/IEEE P1149.1 Test Access Port ..."

Anton T. Dahbura, M. Ümit Uyar, Chi W. Yau (1989)

Details and statistics

DOI: 10.1109/TEST.1989.82277

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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