"A high-resolution jitter measurement technique using ADC sampling."

Sasikumar Cherubal, Abhijit Chatterjee (2001)

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DOI: 10.1109/TEST.2001.966706

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Sasikumar Cherubal, Abhijit Chatterjee:
A high-resolution jitter measurement technique using ADC sampling. ITC 2001: 838-847

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