"A Partial Enhanced-Scan Approach to Robust Delay-Fault Test Generation for ..."

Kwang-Ting Cheng, Srinivas Devadas, Kurt Keutzer (1991)

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DOI: 10.1109/TEST.1991.519700

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Kwang-Ting Cheng, Srinivas Devadas, Kurt Keutzer:
A Partial Enhanced-Scan Approach to Robust Delay-Fault Test Generation for Sequential Circuits. ITC 1991: 403-410

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