"A Self-Testing and Self-Repairing Structure for Ultra-Large Capacity Memories."

Tom Chen, Glen Sunada (1992)

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DOI: 10.1109/TEST.1992.527883

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Tom Chen, Glen Sunada:
A Self-Testing and Self-Repairing Structure for Ultra-Large Capacity Memories. ITC 1992: 623-631

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