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"Algorithmic Read Resistance Trim for Improving Yield and Reducing Test ..."
Daehyun Chang et al. (2023)
- Daehyun Chang, Youngdae Kim, Suksoo Pyo, Shin Hun, Daesop Lee, Sohee Hwang, Jaesik Choi, Siwoong Kim:
Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM. ITC 2023: 87-92
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