"Simulation of an Integrated Design and Test Environment for Mixed-Signal ..."

Stephen C. Bateman, William H. Kao (1992)

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DOI: 10.1109/TEST.1992.527850

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Stephen C. Bateman, William H. Kao:
Simulation of an Integrated Design and Test Environment for Mixed-Signal Integrated Circuits. ITC 1992: 405-414

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