Stop the war!
Остановите войну!
for scientists:
default search action
"Interconnect Test Pattern Generation Algorithm For Meeting Device and ..."
Kendrick Baker, Mehrdad Nourani (2004)
- Kendrick Baker, Mehrdad Nourani:
Interconnect Test Pattern Generation Algorithm For Meeting Device and Global SSO Limits With Safe Initial Vectors. ITC 2004: 163-172
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.