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"Characterize Predicted vs Actual IR Drop in a Chip Using Scan Clocks."
Zahi S. Abuhamdeh et al. (2006)
- Zahi S. Abuhamdeh, Philip Pears, Jeff Remmers, Alfred L. Crouch, Bob Hannagan:
Characterize Predicted vs Actual IR Drop in a Chip Using Scan Clocks. ITC 2006: 1-8
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