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"The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test ..."

Chung-Huang Yeh, Jwu E. Chen (2020)

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DOI: 10.1109/ITC-ASIA51099.2020.00027

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Chung-Huang Yeh, Jwu E. Chen:
The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing. ITC-Asia 2020: 88-93

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