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"Automatic Generation of In-Circuit Tests for Board Assembly Defects."

Harm van Schaaijk, Martien Spierings, Erik Jan Marinissen (2018)

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DOI: 10.1109/ITC-ASIA.2018.00013

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  - conf/itc-asia/SchaaijkSM18
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Harm van Schaaijk, Martien Spierings, Erik Jan Marinissen:
Automatic Generation of In-Circuit Tests for Board Assembly Defects. ITC-Asia 2018: 13-18

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