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"Weak Die Screening by Feature Prioritized Random Forest for Improving ..."

Shian-Yu Lin et al. (2022)

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DOI: 10.1109/ITCASIA55616.2022.00015

access: closed

type: Conference or Workshop Paper

metadata version: 2023-12-17

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  - conf/itc-asia/LinTWSCL22
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  - https://dblp.org/rec/conf/itc-asia/LinTWSCL22
Shian-Yu Lin, Pai-Yu Tan, Cheng-Wen Wu, Ming-Der Shieh, Chien-Hui Chuang, Gordon Liao:
Weak Die Screening by Feature Prioritized Random Forest for Improving Semiconductor Quality and Reliability. ITC-Asia 2022: 25-30

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