Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Adapting an industrial memory BIST solution for testing CAMs."

Jais Abraham et al. (2017)

> Home

Details and statistics

DOI: 10.1109/ITC-ASIA.2017.8097123

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc-asia/AbrahamGCSDNRK17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc-asia/AbrahamGCSDNRK17
Jais Abraham, Uttam Garg, Glenn Colón-Bonet, Ramesh Sharma, Chennian Di, Benoit Nadeau-Dostie, Etienne Racine, Martin Keim:
Adapting an industrial memory BIST solution for testing CAMs. ITC-Asia 2017: 112-117

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.