"Fault-resilient decoders and memories made of unreliable components."

Bane Vasic et al. (2015)

Details and statistics

DOI: 10.1109/ITA.2015.7308978

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

a service of  Schloss Dagstuhl - Leibniz Center for Informatics