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"Noise Analysis and Removal in 3D Electron Microscopy."

Joris Roels et al. (2014)

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DOI: 10.1007/978-3-319-14249-4_4

access: closed

type: Conference or Workshop Paper

metadata version: 2020-06-15

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  dblp key:
  - conf/isvc/RoelsAVLSLP14
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  - https://dblp.org/rec/conf/isvc/RoelsAVLSLP14
Joris Roels, Jan Aelterman, Jonas De Vylder, Hiêp Quang Luong, Yvan Saeys, Saskia Lippens, Wilfried Philips:
Noise Analysis and Removal in 3D Electron Microscopy. ISVC (1) 2014: 31-40

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