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"FDG: a precise measurement of fault diagnosability gain of test cases."

Gabin An, Shin Yoo (2022)

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DOI: 10.1145/3533767.3534370

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-26

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  dblp key:
  - conf/issta/AnY22
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Gabin An, Shin Yoo:
FDG: a precise measurement of fault diagnosability gain of test cases. ISSTA 2022: 14-26

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