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"A Multi-factor Software Reliability Model Based on Logistic Regression."

Hiroyuki Okamura, Yusuke Etani, Tadashi Dohi (2010)

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DOI: 10.1109/ISSRE.2010.14

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/issre/OkamuraED10
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  persistent URL:
  - https://dblp.org/rec/conf/issre/OkamuraED10
Hiroyuki Okamura, Yusuke Etani, Tadashi Dohi:
A Multi-factor Software Reliability Model Based on Logistic Regression. ISSRE 2010: 31-40

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