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"Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic ..."

Mitsuya Fukazawa et al. (2007)

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DOI: 10.1109/ISSCC.2007.373407

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  - https://dblp.org/rec/conf/isscc/FukazawaMUAKMTN07
Mitsuya Fukazawa, Tetsuro Matsuno, Toshifumi Uemura, Rei Akiyama, Tetsuya Kagemoto, Hiroshi Makino, Hidehiro Takata, Makoto Nagata:
Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variations in SoCs. ISSCC 2007: 288-603

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