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"27.3 EM and Power SCA-Resilient AES-256 in 65nm CMOS Through ..."

Debayan Das et al. (2020)

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DOI: 10.1109/ISSCC19947.2020.9062997

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-08

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Debayan Das, Josef Danial, Anupam Golder, Nirmoy Modak, Shovan Maity, Baibhab Chatterjee, Dong-Hyun Seo, Muya Chang, Avinash Varna, Harish Krishnamurthy, Sanu Mathew, Santosh Ghosh, Arijit Raychowdhury, Shreyas Sen:
27.3 EM and Power SCA-Resilient AES-256 in 65nm CMOS Through >350× Current-Domain Signature Attenuation. ISSCC 2020: 424-426

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