Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Measurement of Nano-Displacement Based on In-Plane Suspended-Gate MOSFET ..."

Éric Colinet et al. (2008)

> Home

Details and statistics

DOI: 10.1109/ISSCC.2008.4523192

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/isscc/ColinetDARMDOCABl08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/isscc/ColinetDARMDOCABl08
Éric Colinet, Cedric Durand, Patrick Audebert, Philippe Renaux, Denis Mercier, Laurent Duraffourg, Eric Ollier, Fabrice Casset, Pascal Ancey, Lionel Buchaillot, Adrian M. Ionescu:
Measurement of Nano-Displacement Based on In-Plane Suspended-Gate MOSFET Detection Compatible with a Front-End CMOS Process. ISSCC 2008: 332-333

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.