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"Fast stress analysis for runtime reliability enhancement of 3D IC using ..."

Lang Zhang, Hai Wang, Sheldon X.-D. Tan (2016)

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DOI: 10.1109/ISQED.2016.7479196

access: closed

type: Conference or Workshop Paper

metadata version: 2018-02-20

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Lang Zhang, Hai Wang, Sheldon X.-D. Tan:
Fast stress analysis for runtime reliability enhancement of 3D IC using artificial neural network. ISQED 2016: 173-178

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