"Fast stress analysis for runtime reliability enhancement of 3D IC using ..."

Lang Zhang, Hai Wang, Sheldon X.-D. Tan (2016)

Details and statistics

DOI: 10.1109/ISQED.2016.7479196

access: closed

type: Conference or Workshop Paper

metadata version: 2018-02-20

a service of  Schloss Dagstuhl - Leibniz Center for Informatics