"Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic ..."

Bin Zhang, Michael Orshansky (2008)

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DOI: 10.1109/ISQED.2008.4479836

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Bin Zhang, Michael Orshansky:
Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation. ISQED 2008: 774-779

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