"Automatic Test Pattern Generation for Double Stuck-at Faults Based on Test ..."

Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita (2019)

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DOI: 10.1109/ISQED.2019.8697831

access: closed

type: Conference or Workshop Paper

metadata version: 2019-12-27

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Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita:
Automatic Test Pattern Generation for Double Stuck-at Faults Based on Test Patterns of Single Faults. ISQED 2019: 284-290

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