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"Characterizing the Current Degradation of Abnormally Structured MOS ..."
Jin-Kyu Park et al. (2002)
- Jin-Kyu Park, Keun-Ho Lee, Chang-Sub Lee, Gi-Young Yang, Young-Kwan Park, Jeong-Taek Kong:
Characterizing the Current Degradation of Abnormally Structured MOS Transistors Using a 3D Poisson Solver. ISQED 2002: 322-325
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