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"High sigma statistical hold time analysis in FinFET sequential circuits."

Sam C. Lo, Taylor T. Lee, Aaron J. Barker (2017)

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DOI: 10.1109/ISQED.2017.7918319

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-11

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  dblp key:
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Sam C. Lo, Taylor T. Lee, Aaron J. Barker:
High sigma statistical hold time analysis in FinFET sequential circuits. ISQED 2017: 215-220

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