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"A simple array-based test structure for the AC variability ..."

Karthik Balakrishnan, Keith A. Jenkins, Duane S. Boning (2011)

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DOI: 10.1109/ISQED.2011.5770779

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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  - conf/isqed/BalakrishnanJB11
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Karthik Balakrishnan, Keith A. Jenkins, Duane S. Boning:
A simple array-based test structure for the AC variability characterization of MOSFETs. ISQED 2011: 539-544

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