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"IC failure mechanisms yesterday, today, tomorrow: implications from test ..."

Anne E. Gattiker (2006)

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DOI: 10.1145/1123008.1123018

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Anne E. Gattiker:
IC failure mechanisms yesterday, today, tomorrow: implications from test to DFM. ISPD 2006: 47

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