"Analysis of Test Environment Configuration for High-Speed Link Chip ..."

Yunseong Jo, Hyuntae Kim, Jaeduk Han (2024)

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DOI: 10.1109/ISOCC62682.2024.10762686

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-19

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Yunseong Jo, Hyuntae Kim, Jaeduk Han:
Analysis of Test Environment Configuration for High-Speed Link Chip Measurement. ISOCC 2024: 430-431

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