"Recognition of Plasma-Induced X-Ray Photoelectron Spectroscopy Fault ..."

Byungwhan Kim, Sooyoun Kim, Sang Jeen Hong (2006)

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DOI: 10.1007/11760191_151

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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  - conf/isnn/KimKH06a
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Byungwhan Kim, Sooyoun Kim, Sang Jeen Hong:
Recognition of Plasma-Induced X-Ray Photoelectron Spectroscopy Fault Pattern Using Wavelet and Neural Network. ISNN (2) 2006: 1036-1042

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