"Pin Defect Inspection with X-ray Images."

Hsien-Pei Kao et al. (2017)

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DOI: 10.1007/978-3-319-59081-3_54

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-14

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  dblp key:
  - conf/isnn/KaoTCWF17
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Hsien-Pei Kao, Tzu-Chia Tung, Hong-Yi Chen, Cheng-Shih Wong, Chiou-Shann Fuh:
Pin Defect Inspection with X-ray Images. ISNN (2) 2017: 465-473

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