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"Impact of back gate biasing schemes on energy and robustness of ULV logic ..."
Guerric de Streel, David Bol (2013)
- Guerric de Streel, David Bol:
Impact of back gate biasing schemes on energy and robustness of ULV logic in 28nm UTBB FDSOI technology. ISLPED 2013: 255-260
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