Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Voltage Noise Induced DRAM Soft Error Reduction Technique for 3D-CPUs."

Tiantao Lu et al. (2016)

> Home

Details and statistics

DOI: 10.1145/2934583.2934589

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/islped/LuSYS16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/islped/LuSYS16
Tiantao Lu, Caleb Serafy, Zhiyuan Yang, Ankur Srivastava:
Voltage Noise Induced DRAM Soft Error Reduction Technique for 3D-CPUs. ISLPED 2016: 82-87

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.