"Modeling and analysis of leakage induced damping effect in low voltage LSIs."

Jie Gu, John Keane, Chris H. Kim (2006)

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DOI: 10.1145/1165573.1165668

access: closed

type: Conference or Workshop Paper

metadata version: 2021-03-02

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  - conf/islped/GuKK06
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Jie Gu, John Keane, Chris H. Kim:
Modeling and analysis of leakage induced damping effect in low voltage LSIs. ISLPED 2006: 382-387

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