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"Validation on Duality in Impact-ionization Carrier Generation at the Onset ..."

Takahiro Iizuka et al. (2019)

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DOI: 10.1109/ISDCS.2019.8719088

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-30

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  dblp key:
  - conf/isdcs/IizukaHMM19
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Takahiro Iizuka, Hiroyuki Hashigami, Mitiko Miura-Mattausch, Hans Jürgen Mattausch:
Validation on Duality in Impact-ionization Carrier Generation at the Onset of Snapback in Power MOSFETs. ISDCS 2019: 1-4

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