"Digital built-in self-test of CMOS analog iterative decoders."

Mimi Yiu et al. (2005)

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DOI: 10.1109/ISCAS.2005.1465059

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Mimi Yiu, Chris Winstead, Vincent C. Gaudet, Christian Schlegel:
Digital built-in self-test of CMOS analog iterative decoders. ISCAS (3) 2005: 2204-2207

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