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"Adversarial Sample Generation for Lithography Hotspot Detection."

Shuyuan Sun et al. (2022)

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DOI: 10.1109/ISCAS48785.2022.9937434

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-30

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  dblp key:
  - conf/iscas/SunJY022
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Shuyuan Sun, Yiyang Jiang, Fan Yang, Xuan Zeng:
Adversarial Sample Generation for Lithography Hotspot Detection. ISCAS 2022: 3503-3506

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