"Delay analysis of sub-path on fabricated chips by several path-delay tests."

Takanobu Shiki, Yasuhiro Takashima, Yuichi Nakamura (2010)

Details and statistics

DOI: 10.1109/ISCAS.2010.5537436

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-09

a service of  Schloss Dagstuhl - Leibniz Center for Informatics