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"Reducing Temperature Induced Unreliability in Sub-Threshold Strong PUFs ..."
Nimesh Shah et al. (2020)
- Nimesh Shah, Sumon Kumar Bose, Chip-Hong Chang, Arindam Basu
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Reducing Temperature Induced Unreliability in Sub-Threshold Strong PUFs through Circuit Modeling. ISCAS 2020: 1-5
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