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"An efficient methodology to evaluate nanoscale circuit fault-tolerance ..."

Huifei Rao et al. (2008)

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DOI: 10.1109/ISCAS.2008.4541491

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-09

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  - conf/iscas/RaoCZAWW08
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Huifei Rao, Jie Chen, Vicky H. Zhao, Woon Tiong Ang, I-Chyn Wey, An-Yeu Wu:
An efficient methodology to evaluate nanoscale circuit fault-tolerance performance based on belief propagation. ISCAS 2008: 608-611

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