"Spatial- and temporal-reliability aware design for nano-scale VLSI circuits."

Md. Sajjad Rahaman, Qing Duan, Masud H. Chowdhury (2011)

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DOI: 10.1109/ISCAS.2011.5937751

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Md. Sajjad Rahaman, Qing Duan, Masud H. Chowdhury:
Spatial- and temporal-reliability aware design for nano-scale VLSI circuits. ISCAS 2011: 1057-1060

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