"Towards optimal CMOS lifetime via unified reliability modeling and ..."

Agathoklis Papadopoulos, Theocharis Theocharides, Maria K. Michael (2011)

Details and statistics

DOI: 10.1109/ISCAS.2011.5937749

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-04

a service of  Schloss Dagstuhl - Leibniz Center for Informatics