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"Design and verification of an all-digital on-chip process variation sensor."

Reum Oh, Ji-Woong Jang, Man Young Sung (2013)

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DOI: 10.1109/ISCAS.2013.6572188

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Reum Oh, Ji-Woong Jang, Man Young Sung:
Design and verification of an all-digital on-chip process variation sensor. ISCAS 2013: 1684-1687

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