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"A monitoring circuit for NBTI degradation at 65nm technology node."

Yandong He et al. (2013)

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DOI: 10.1109/ISCAS.2013.6572284

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-14

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  dblp key:
  - conf/iscas/HeHZHZ13
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  - https://dblp.org/rec/conf/iscas/HeHZHZ13
Yandong He, Jie Hong, Ganggang Zhang, Lin Han, Xing Zhang:
A monitoring circuit for NBTI degradation at 65nm technology node. ISCAS 2013: 2083-2086

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