"Improved Read Access in GC-eDRAM Memory by Dual-Negative Word-Line Technique."

Roman Golman et al. (2020)

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DOI: 10.1109/ISCAS45731.2020.9180875

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-18

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Roman Golman, Robert Giterman, Odem Harel, Adam Teman:
Improved Read Access in GC-eDRAM Memory by Dual-Negative Word-Line Technique. ISCAS 2020: 1-5

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