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"Reliability study of a low-voltage Class-E power amplifier in 130nm CMOS."

Jonas Fritzin et al. (2010)

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DOI: 10.1109/ISCAS.2010.5537959

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-09

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Jonas Fritzin, Timmy Sundström, Ted Johansson, Atila Alvandpour:
Reliability study of a low-voltage Class-E power amplifier in 130nm CMOS. ISCAS 2010: 1907-1910

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